Surface Analysis Laboratory Techniques
Surface analysis expertise and insight from our experts
Surface analysis expertise from world-class Intertek scientists is available on a global basis. Client samples are easily transported to the appropriate Intertek laboratory for surface analysis projects. Applications include research and development support, failure analysis, troubleshooting, and quality control.
Surface analysis laboratory techniques and capabilities:
- Optical light microscopes employ the visible or near-visible portion of the electromagnetic spectrum. Applications include use in the life sciences, metallurgy and electronic industries.
- The Scanning Electron Microscope (SEM) analyses the surface of solid objects, producing images of higher resolution than optical microscopy. SEM produces representations of three-dimensional samples from a diverse range of materials. Techniques include cathode-luminescence and back-scattering for surface, contrast and elemental analysis.
- Scanning Electron Microscopy + Energy Dispersive X-ray Analysis (SEM/EDXA) provides analysis of small particles by scanning electron microscopy (SEM) and energy dispersive X-ray analysis (EDXA), possible without destruction or injury to the sample. SEM/EDXA provides qualitative elemental analysis and element localization on samples being analysed.
- Transmission Electron Microscopy (TEM) is used for ultra structural characterisation of a wide range of samples. Applications include morphology, crystallographic and compositional information, including Biological TEM applications.
- X-Ray Diffraction (XRD) is used for characterizing materials. The technique is used to studying powdery particles, particles in liquid suspensions or polycrystalline solids, including bulk or thin film materials.
- X-Ray Photoelectron Spectroscopy (XPS) provides quantitative data of the elemental composition on the surface of a material and is used to study the surface chemistry of thin films, residues, and surface pitting.
AFM Atomic Force Microscopy:
- Atomic Force Microscopy (AFM) studies surface topology and physical properties on a nano-metre scale. Surface imaging is to near atomic resolution, measuring atomic level forces at the sample surface. Van der Waals, electrostatic, capillary, magnetic and ionic forces produce topographical images of the sample.
Vertical Scanning, Phase Shifting Interferometry:
- Vertical scanning interferometry (VSI) is a non-invasive technique used to quantify surface topography of solids such as metals, ceramics, minerals, glasses with high precision.
Need help or have a question?
- EMEA UK:
- +44 161 721 5247
- +31 88 126 8888
- +33 (0) 385 99 12 80
- +65 6805 4800
- 0800 5855888
- +49 711 27311 152
- +41 61 686 4800
- 01 800 5468 3783
- +52 55 5091 2150
- +55 11 2322 8033
- +61 1300 046 837
- +91 22 4245 0207
- +971 4 317 8777