Scanning electron microscopy (SEM) services driving insight into the study of surfaces and particles. Helping to resolve failure or contamination analysis of components and aid visualization of sample texture and morphology.

Scanning electron microscopy analysis of the surfaces of materials, particles and fibres is a critical tool for the resolution of contamination issues, investigations into component failure, identification of unknown particulates or in the study of the interaction between substances and substrates. It can also provide a wealth of information to support research into materials, chemicals, or biological samples.

The process of interpreting SEM images is not always clear and direct. In tasks such as the interpretation of surface pitting on metal components, the identification of particulates, or the exploration of physical and chemical characteristics of materials, SEM becomes a truly powerful technique if appropriate sample preparation methods are used and experienced microscopists perform the analysis.

Intertek's SEM scientists have amassed in-depth industry knowledge across manufacturing, construction, chemicals, energy, healthcare, electronics, polymers and consumer products. Their expertise can assist you in resolving issues, performing quality control, and dramatically increasing understanding of materials.
By applying SEM to study surfaces, materials, films, coatings, minerals, raw materials, metals, plastics, food, dust, catalysts, biological tissues, contaminants, or unknown substances, our experts produce high-resolution images, make pertinent observations and measurements. Our microscopy team are also able to examine the internal structure of samples through a variety of cross-sectioning techniques. By working closely with you, our experts' years of dedicated industry experience in sample preparation and sample analysis will provide you with valuable insights.
Scanning electron microscopy - Energy Dispersive X-ray (SEM/EDX)
SEM/EDX facilitates the study of particles and surfaces with the added benefit of acquiring elemental composition for the sample being studied. Elemental mapping and elemental distribution across the surface of the sample is also possible.
Remote View Scanning Electron Microscopy Services
Remote View SEM enables real-time interaction with the analyst and instrument allowing direct examination of failures, surface features, particle shapes, and chemical compositions in order to accelerate critical decision making in support of failure or quality investigations or product development.
Cryo Scanning Electron Microscopy (Cryo-SEM)
Our scientists use cryopreservation techniques, such as high-pressure freezing for liquid-based samples, to preserve the micro- or nano-structure of formulations, such as multi-layered vesicles, liposomes, dispersions, or engineered particulates.

Alongside SEM we can also engage complementary microscopy techniques (optical microscopy or TEM) and spectroscopy techniques, for example Infra-red (FTIR) Microscopy or RAMAN Microscopy. Our surface analysis capabilities include Time-of-Flight Secondary Ion Mass Spectrometry (SIMS). All of these are used in multi-technique strategic approaches to get a comprehensive picture and the most relevant information for your specific industry demands.

Many of our SEM experts possess over 20 years of key industry experience and accumulated knowledge. Our microscopy laboratories across North America and Europe routinely provide support for research, failure analysis, troubleshooting and quality control requirements for global clients, making us an ideal provider for your SEM analysis needs.

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