X-Ray Fluorescence Spectroscopy (Allentown Lab)
Rapid quantitative and semi-quantitative screening of solid samples for elemental composition to determine trace levels of chemicals
X-Ray Fluorescence (XRF) is an elemental analytical technique in which incident X-rays induce electronic excitations that, upon relaxation, produce fluorescence at characteristic energies for each element. XRF can perform fast quantitative and semi-quantitative analysis of elements in samples for elemental composition to provide useful information about trace levels of chemicals of concern and aid in the identification of bulk samples. It can also provide quick comparisons between samples that exhibit differences in performance that may be due to differences in chemistry. Samples are typically prepared as loose powders, pressed pellets, or fused disks.
All of this can be determined using two different XRF techniques - energy-dispersive XRF (EXDRF) and wavelength-dispersive XRF (WDXRF). While the former provides some advantages with respect to speed and portability, the latter provide better accuracy and sensitivity and the capability of detecting a larger number of elements, between Na - U from parts per million to weight percent concentrations.
To provide our clients the most accurate rapid screening of different sample types for a wide range of elements, our Allentown lab chooses to provide elemental analysis via WDXRF.
Other potential uses for XRF:
- Measures elements in difficult to digest samples that might preclude the use of ICP
- Complements other analytical techniques, such as X-ray diffraction, that may require some knowledge about elemental composition for more accurate data interpretation
- Resolves fluorescence wavelengths for accurate identification of elements using crystal monochromators (WDXRF)
- Multi elemental analysis with the appropriate software program; good for screening unknowns to identify major, minor, and trace elements (WDXRF)
- Perform quantitation using a fundamental parameters calibration model with a single point standard provided by the vendor, which provides semi-quantitative analysis of elemental concentrations to identifying bulk and trace components in an unknown sample
- Generates quantitative elemental results that are both precise and accurate in specific materials such as mixed oxides or catalysts by producing calibration curves that are prepared from synthetic standards matched to samples can generate.
With Intertek as your Total Quality Assurance partner, we can meet all your XRF analysis needs.