Save time and money in product development using HALT and HASS testing.
Highly Accelerated Life Test (HALT) and Highly Accelerated Stress Screen (HASS) are often used in conjunction with one another. During the HALT process, a product is subject to increasing stress levels of temperature and vibration (independently and in combination), rapid thermal transitions, and other stresses specifically related to the operation of your product. The information goals of HALT are to:
HALT was developed specifically for solid state electronics, but can be applied to any product, with the correct equipment. In general, the information goal of HALT is most effectively met by testing at the lowest possible sub-assembly:
Highly Accelerated Stress Screen- HASS
Once the HALT process has been completed, and the product has been ruggedized, we can develop a custom production screen to identify process defects. Running a HASS: