TOF-SIMS Spectrometry Analysis
TOF-SIMS time of flight secondary ion mass spectrometry.
Time of Flight Secondary Ion mass spectrometry (TOF-SIMS or TOFMS) provides trace molecular analysis and sub-micron shallow surface measurement of various materials. TOF-SIMS analysis detects low concentrations of molecules and elements to sub-ppm levels. TOF-SIMS helps clients understand surface modifications in organic and inorganic films from exposure to environmental and process conditions.
TOF-SIMS provides qualitative surface elemental and chemical analysis of organics and inorganics, along with elemental and chemical imaging. TOF-SIMS laboratory capabilities include inert sample handling and cold stage for high vapor pressure samples.
TOF-SIMS analysis applications:
- Surface contamination and characterization in organic and inorganic coatings
- Impurity identification
- Thin film composition
- Thin film impurities
- Elemental analysis
Industries benefiting from TOF-SIMS analysis include electronics, aerospace, semiconductors, automotive, solar, and more. Intertek TOF-SIMS scientists have years of industry experience.
Spectrometry and surface analysis:
Request more information to see how Intertek can help your organization with TOF-SIMS Spectrometry Analysis.