Intertek (www.intertek.com)
 

Transmission Electron Microscopy Analysis

Industries serviced: Chemicals

E-mail Us

Call Us

EMEA UK:+44 161 721 5247
MSG UK:+44 1642 435 788

Intertek MSG
The Wilton Centre
Redcar
TS10 4RF 
United Kingdom

Meet Our People 

Download details on:
Capabilities (PDF 142 KB)
Location (PDF 114 KB)

Transmission Electron Microscopy expertise for micro-analysis and materials characterisation.

Intertek Transmission Electron Microscopy (TEM) laboratory services yields information on the internal structure of client materials. Sample preparation may involve not only the skilled art of ultramicrotomy, but also embrittlement by cooling or chemical fixation, and staining to impart contrast to the image. Ultra-fine particulates or dried latex materials may also be held on thin support films for examination.

TEM studies analysis and applications include:

  • Degree of encapsulation of titanium dioxide within polymeric material.
  • Size and structure of nano-inorganic materials and their dispersion within an epoxy matrix.
  • Exfoliation and distribution of nano-clay particles within epoxy systems for use within the aerospace industry.
  • Characterisation of catalyst particle architecture.
  • Study of fracture effects on impact modifier particles and acrylic matrix using chemical staining techniques.
  • Assessment of size and shape for nano-metallic particles used in the electronics industry.
  • Determination of metallised layer thicknesss and structure within packaging applications.
  • Structure of carbon nanotubes along with EDX analysis of metallic seed particles used in their production.
  • Morphology of adhesive systems.
  • Study of the size and shape characteristics of fluoropolymer particles and the effect this has on parameters such as extrusion pressure.

Analagous in function to a light microscope, the transmission electron microscope uses magnetic lenses to focus a magnified image onto a phosphorescent screen or digital camera.TEM often requires preparation of a sample film or section no thicker than 60-80 nanometres, through which the electron beam is transmitted.

Related Microscopy Services:

to see how Intertek can help your organization with Transmission Electron Microscopy Analysis.

© Intertek Group plc. Disclaimer
Home Services What We Do Contact Us