Transmission Electron Microscopy
Transmission electron microscopy (TEM) analysis.
Intertek Transmission Electron Microscopy (TEM) yields information on the internal structure of materials. Sample preparation may include skilled ultramicrotomy, embrittlement by cooling, chemical fixation, and staining to impart contrast to the image. Ultra-fine particulates or dried latex materials may also be held on thin support films for examination.
TEM analysis:
- Degree of encapsulation of titanium dioxide within polymeric material.
- Size and structure of nano-inorganic materials and their dispersion within an epoxy matrix.
- Exfoliation and distribution of nano-clay particles within epoxy systems for use within the aerospace industry.
- Characterisation of catalyst particle architecture.
- Study of fracture effects on impact modifier particles and acrylic matrix using chemical staining techniques.
- Assessment of size and shape for nano-metallic particles used in the electronics industry.
- Determination of metallised layer thicknesss and structure within packaging applications.
- Structure of carbon nanotubes along with EDX analysis of metallic seed particles used in their production.
- Morphology of adhesive systems.
- Study of the size and shape characteristics of fluoropolymer particles and the effect this has on parameters such as extrusion pressure.
A transmission electron microscope uses magnetic lenses to focus a magnified image onto a phosphorescent screen or digital camera. TEM may require preparation of a sample film or section no thicker than 60-80 nanometres, through which the electron beam is transmitted.
Contact us to see how Intertek can help your organization with Transmission Electron Microscopy.