Scanning Electron Microscopy

Scanning electron microscopy (SEM) laboratory.

Scanning electron microscopy (SEM) analyzes the surface of materials. SEM measures and evaluates surface pitting, failure analysis, characterization of dust, deposits, contaminants, particles, filter residues, and other applications.

Intertek scanning electron microscopy scientists analyse the surface of solid objects, producing higher resolution images than optical microscopy. SEM produces representations of three-dimensional samples from a diverse range of materials. Back-scatter and cathodoluminescence (SEM-CL) are used to evaluate a wide range of samples. Microstructural characterization includes the analysis of materials, polymers, films, coatings, geological and mineral core samples, pharmaceuticals, raw materials, metals, plastics, ceramics, glass, food, dust, contaminants, unknowns and other products.

SEM labs provide elemental analysis of solid samples, impurities, and the identification of physical and chemical defects. The laboratories provide anaytical surface science expertise to support research, failure analysis, troubleshooting, quality control and other requirements.

SEM/Energy Dispersive X-ray Analysis is also available. SEM/EDXA allows the analysis of small particles by scanning electron microscopy and energy dispersive X-ray analysis, resulting in testing without destruction or injury to the sample. SEM/EDXA provides qualitative elemental analysis and element localization on samples being analysed. 

Remote View Scanning Electron Microscopy (SEM) Services
A remote viewing option is also available, enabling the customer to interact in real-time with the microscopist as they view a material surface or cross section. As a result, a failure, surface features, particle shapes, and chemical composition can be directly explored and a conclusion reached immediately. This new testing service will greatly accelerate critical decision making relating to a failure investigations or product development effort. SEM imaging is valuable for polymers, electronic materials, electrical devices or free-flowing powders, making it a great first step in many failure investigation efforts.

Contact us to see how Intertek can help your organization with Scanning Electron Microscopy.