Scanning Electron Microscopy
Scanning electron microscopy (SEM) services are used to study surfaces and particles, targeting failure analysis of components, visualization of texture and morphology, or contamination of materials
Scanning electron microscopy (SEM) analyses the surfaces of materials, particles and fibres so that fine details can be measured and assessed via image analysis. SEM provides a means for industry to resolve contamination issues, investigate component failure, identify unknown particulates or study the interaction between substances and their substrates. It can also provide a wealth of information to support research of materials, chemicals or biological samples.
The process of interpreting SEM images is not always clear and direct. In tasks such as the interpretation of surface pitting on metal components the identification of particulates, or the exploration of physical and chemical characteristics of material, SEM becomes a truly powerful technique if appropriate sample preparation methods are used and experienced microscopists perform the analysis.
Intertek's SEM scientists have amassed in-depth industry knowledge across manufacturing, construction, chemicals, energy, healthcare, electronics, polymers and consumer products. Their expertise can assist you in resolving issues, perform quality control and dramatically increase understanding of materials.
By applying SEM to study surfaces, materials, films, coatings, minerals, raw materials, metals, plastics, food, dust, catalysts, biological tissues, contaminants or unknown substances, our experts produce high resolution images, make pertinent observations and measurements. They are also able to examine the internal structure of samples through a variety of cross-sectioning techniques. By working closely with you, our experts’ years of dedicated industry experience in sample preparation and sample analysis will provide you with valuable insight.
Scanning electron microscopy - Energy Dispersive X-ray (SEM/EDX)
SEM/EDX facilitates the study of particles and surfaces with the added benefit of acquiring elemental composition for the sample being studied. Elemental mapping and distribution across the surface of the sample is also available.
Remote View Scanning Electron Microscopy Services
Remote View SEM enables real-time interaction with the analyst and instrument allowing direct examination of failures, surface features, particle shapes, and chemical compositions in order to accelerate critical decision making in support of failure or quality investigations or product development.
Cryo Scanning Electron Microscopy (Cryo-SEM)
Our scientists use cryopreservation such as high pressure freezing for liquid-based samples to preserve the micro- or nano-structure of the formulations such as multi-layered vesicles, liposomes, dispersions or engineered particulates.
Alongside SEM we can also engage complementary microscopy techniques (optical microscopy or TEM) and spectroscopy techniques, for example Infra-red (FTIR) Microscopy or RAMAN Microscopy. Our surface analysis capabilities include Time-of-Flight Secondary Ion Mass Spectrometry (SIMS). All of these are used in multi-technique strategic approaches to get a comprehensive picture and the most relevant information for your specific industry demands.
Many of our SEM experts possess over 20 years of key industry experience and accumulated knowledge. Our microscopy laboratories across North America and Europe routinely provide support for research, failure analysis, troubleshooting and quality control requirements to a global array of clients, making us an ideal provider for your SEM analysis needs.
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