Intertek Presents: NEMA 77 - Understanding Temporal Light Artifacts Criteria & Test Methods

September 21, 2017 @ 2:00 p.m. Eastern Time

NEMA 77, “Temporal Light Artifacts: Test Methods and Guidance for Acceptance Criteria,” addresses measurement and recommended limits for flicker and stroboscopic effect in solid state LED lamps. Intertek is hosting a webinar for NEMA experts to discuss the goal of NEMA 77 as well as definitions, applicability, and methods of measurement.

Complete for the form below to register for this free webinar.