Micro X-Ray Fluorescence (Micro-XRF) provides rapid elemental analysis of materials.

Micro X-Ray Fluorescence (Micro-XRF) analysis is an accurate, rapid, cost effective, test method for elemental surface analysis. Micro XRF provides fast screening and detection of trace elements, with advanced non-destructive elemental analysis. With the flexibility to work across a wide range of sample types and shapes, there is minimal sample preparation.

Materials tested by Intertek include diverse components like printed circuit boards, polymers, medical devices, coated surfaces, and more. The ability to rapidly map surface elemental distribution is available for a wide range of materials.

The Micro XRF technique is effective for deposit and other unknowns characterization and analysis, and is a powerful analytical tool for problem-solving. Micro XRF is designed to meet regulatory testing requirements for RoHS II and other programs.

Intertek's Seiko 600VX Micro XRF capabilities include:

  • High speed integrated elemental mapping
  • High precision, micro-spot analysis of film thickness and composition
  • High resolution imaging
  • High count rate detector, which does not require liquid nitrogen
  • Component resolution down to 0.5 mm
  • 30 cm X 30 cm mapping area
Elemental analysis and expertise:

Related Links

Trace Metals Analysis ICP-MS
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