Contamination Analysis by SEM and EDX
Trace contamination analysis using SEM and EDX.
Intertek microscopy laboratories offer micro-elemental contamination analysis on particulate materials. Both Scanning Electron Microscopy (SEM) and Energy Dispersive X-Ray (EDX) analysis can identify and characterise contamination particles, surfaces and more. When using the combination of SEM interfaced with EDX, qualitative information can be obtained on the full elemental composition of an unknown contaminant or elemental species.
Contamination samples tested include deposits, coatings, scales, materials and products. Intertek SEM and EDX scientists work with the customer to best approach a contamination problem. Contamination analysis by SEM and EDX is prompt and timely, helping customers quickly determine the cause and possible solutions to the contamination problem they are experiencing.
Using EDX microanalysis for particle contamination, for example, each individual particle can be separately probed with the focused electron beam. The resulting EDX spectra show the different elemental composition from each particle probed. This information is then used by customers to resolve the nature and origin of contamination within manufacturing units and other applications.
Contamination testing:
Contact us to see how Intertek can help your organization with Contamination Analysis by SEM and EDX.