Intertek MSG
The Wilton Centre
Redcar
TS10 4RF 
United Kingdom

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XPS X-Ray Spectroscopy

X-Ray photoelectron spectroscopy (XPS) analysis.

X-Ray photoelectron spectroscopy (XPS) laboratories provide quantitative elemental identification and information on the chemical state of materials, including chemcial bonding and oxidation state, within the top 10 nm of a surface. Two-dimensional imaging allows for the mapping of surface chemistry with a spatial resolution of a few microns. Also known as Electron Spectroscopy for Chemical Analysis (ESCA), XPS determines surface layer elemental and functional group composition in the top 5 to 10 nm (nanometres) of a material.

XPS is complementary to Secondary Ion Mass Spectrometry (SIMS), which is focused on molecular identification. 

XPS analysis applications: 

  • Identification of surface contamination
  • Film and coating defect analysis
  • Characterisation of flexible electronics components
  • 'Plane of failure' analysis for coatings, adhesive joints or complex laminates
  • Bulk analyses, such as Cr VI determination or trace analysis
Surface analysis:

to see how Intertek can help your organization with XPS X-Ray Spectroscopy.