SSIMS Static Secondary Ion Mass Spectrometry

Static secondary ion mass spectrometry (SSIMS) identifies molecules in extremely shallow molecular surfaces.

Static Secondary Ion Mass Spectrometry (Surface SIMS, SSIMS) allows molecular identification of organic and inorganic materials on surfaces. Often the surface of a material is what that delivers the benefit or special feature to a product.

Intertek scientists measure the surface situation and provide clients with vital data and a better understanding of what is really going on at the surface level. Intertek MSG has wide and varied experience in using SSIMS to identify and characterise problems only SSIMS is best placed to handle. 

The extremely shallow molecular surface analysis depth of SSIMS, compared to other microscopy techniques, allow clients to better understand the absolute nanoscale surface of a material. This information is useful for trouble-shooting production problems, research and development, resolving patent disputes and many other applications.

It is even possible to utilise the SSIMS technique to 'drill down' from the surface of a material and study the variation of chemcial composition with depth ("Depth Profiling") - for instance to investigation the deposition of contaminants on a surface.

Surface SIMS provides answers to critical issues:  

• A pharmaceutical manufacturer's patent was threatened by a rival company. Work from the Intertek SSIMS team analysed the drug and compared it to its generic rival. The SSIMS analysis results were essential to the successful result of the consequential patent litigation in favour of the client.
• Identification of silicone-based lubricants that can stop production lines, leading to often expensive disputes between suppliers and customers.
• Microscopic blobs of silicone lubricant in the wrong place can give significant problems with carbon fibre. In one case silicone lubricant caused problems with the production of cruise missiles. Use of SSIMS identified the issue and helped to resolve the problem.
• A pharmaceutical manufacturer's patent was threatened by a rival company. Work from the Intertek SSIMS team analysed the drug and compared it to its generic rival. The SSIMS analysis results were essential to the successful result of the consequential patent litigation in favour of the client.

Contact us to see how Intertek can help your organization with SSIMS Static Secondary Ion Mass Spectrometry.